AP54RHC420ENT

AP54RHC420 Latch

Apogee Semiconductor AP54RHC420 Latch is radiation-hardened by design, a dual quad-SR latch with cold sparing and Schmitt trigger inputs. This latch delivers high resiliency to Single-Event Effects (SEE) and Total Ionizing Dose (TID). The AP54RHC420 latch features 5ns transient detection at V_CC > 3V and single-supply level translation. This latch support inputs and/or outputs, which can be cross-strapped with no impact on operation or leakage current, simplifying cold-sparing implementation. The AP54RHC420 latch also supports a redundant output stage with high drive capability and low static power loss. This latch is ideally suited for commercial spaces and other applications that demand radiation tolerance and high reliability. Typical applications include system-level glitch latching, power supply transient detection, single-bit latching, and discrete state machines.